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ELECTRON IRRADIATION EFFECTS ON THIN CAF2 FILMSKOCH FA; VOOK RW.1973; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1973; VOL. 10; NO 1; PP. 313-315; BIBL. 8 REF.Serial Issue

SYSTEM FOR REFLECTION ELECTRON MICROSCOPY AND ELECTRON DIFFRACTION AT INTERMEDIATE NERGIES.COWLEY JM; ALBAIN JL; HEMBREE GG et al.1975; REV. SCI. INSTRUM.; U.S.A.; DA. 1975; VOL. 46; NO 7; PP. 826-829; BIBL. 8 REF.Article

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